Texture Distribution and Development through the Thickness of Grain Oriented Silicon Steel

Abstract:

The texture distribution and development of grain oriented silicon steel with different production stages have been investigated by electron backscatter diffraction technique (EBSD). The results indicated that below the surface the intensity of {001}<110> of α-fiber was strongest with a amount of {110}<001> texture and γ-fiber. After first cold rolling and normalizing, in the corresponding position the {110}<001> texture and γ-fiber appeared again. The {110}<001> grains and γ-fiber after decarb-annealing was helpful to accelerate the abnormal growth of second grain nucleation.

• Periodical: Materials Science Forum (Volumes 654-656)
• Pages: 2354-2357
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.654-656.2354
• Online since: June 2010
• Authors: Zhi Fen Wang, Rong Dong Han, Ping He Li, Ji Xiong Liu, Yi Qiang Sun
• Keywords: Electron Backscatter Diffraction (EBSD), Grain Oriented Silicon Steel, Texture

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