Challenges Associated with the Characterisation of Nanocrystalline Materials Using Atom Probe Tomography

Feng Zai Tang; Talukder Alam; Michael P. Moody; Baptiste Gault; Julie M. Cairney

doi:10.4028/www.scientific.net/MSF.654-656.2366

Paper Titles

Grain Boundary Engineering and Alterations in Anisotropy of Interfacial Properties
p.2350

Texture Distribution and Development through the Thickness of Grain Oriented Silicon Steel
p.2354

Three Dimensional Microstructure Characterization of an Al-Zn-Mg Alloy Foam Using Synchrotron X-Ray Microtomography
p.2358

TEM and STEM Study of the Au Nano-Particles Supported on Cerium Oxides
p.2362

Challenges Associated with the Characterisation of Nanocrystalline Materials Using Atom Probe Tomography
p.2366

The Fluctuation of Indium Composition in InGaN Based LED Investigated by Atom Probe Tomography (APT)
p.2370

Characterisation of the Densification Mechanism of Plasma Sprayed Cordierite
p.2374

Microstructure for Printed Multilayer LTCC Tape of Different Paste Rheology
p.2378

Effect of Alumina Starting Materials on Spheroidization in Flame Fusion Method
p.2382

HomeMaterials Science ForumMaterials Science Forum Vols. 654-656Challenges Associated with the Characterisation of...

Challenges Associated with the Characterisation of Nanocrystalline Materials Using Atom Probe Tomography

Abstract:

Atom probe tomography provides compositional information in three dimensions at the atomic scale, and is therefore extremely suited to the study of nanocrystalline materials. In this paper we present atom probe results from the investigation of nanocomposite TiSi¬Nx coatings and nanocrystalline Al. We address some of the major challenges associated with the study of nanocrystalline materials, including specimen preparation, visualisation, common artefacts in the data and approaches to quantitative analysis. We also discuss the potential for the technique to relate crystallographic information to the compositional maps.

You might also be interested in these eBooks

View Preview

Info:

Periodical:

Materials Science Forum (Volumes 654-656)

Pages:

2366-2369

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.654-656.2366

Citation:

Cite this paper

Online since:

June 2010

Authors:

Feng Zai Tang, Talukder Alam, Michael P. Moody, Baptiste Gault, Julie M. Cairney

Keywords:

Atom Probe Tomography (APT), Nanocomposite Coating, Nanocrystalline Material

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

References

[1] H. Gleiter, Prog. Mater. Sci., Vol. 33 (1989), p.223.

Google Scholar

[2] D.S. Gianola, S. Van Petegem, M. Legros, S. Brandstetter, H. Van Swygenhoven and K.J. Hemker, Acta Mater., Vol. 54 (2006), p.2253.

DOI: 10.1016/j.actamat.2006.01.023

Google Scholar

[3] J.M. Cairney, M.J. Hoffman, P.J. Martin and A. Bendavid, Thin Solid Films, Vol. 479 (2005), p.193.

Google Scholar

[4] J. Patscheider, T. Zehnder and M. Diserens, Surf. Coat. Technol. 146-147 (2001) 201.

Google Scholar

[5] F. Tang, B. Gault, S.P. Ringer, A. Bendavid, P. Martin and J.M. Cairney, Scripta Mater., in submission.

Google Scholar

[6] D.S. Gianola, B.G. Mendis, X.M. Cheng and K.J. Hemker, Mat. Sci. Eng. A, Vol. 483 (2008), p.637.

Google Scholar

[7] J.M. Cairney, D.W. Saxey, D. McGrouther and S.P. Ringer, Physica B, Vol. 394 (2007), p.267.

Google Scholar

[8] M.K. Miller, K.F. Russell, K. Thompson, R. Alvis R and D.J. Larson, Microsc. Microanal., Vol. 13 (2007), p.428.

Google Scholar

[9] D. Blavette, P. Duval, L. Letellier and M. Guttmann. Acta Mater., Vol. 44 (1996), p.4995. Fig 4 Field desorption map from nc-Al. Dotted lines show the grain boundaries. Major poles are indexed.

Google Scholar