Challenges Associated with the Characterisation of Nanocrystalline Materials Using Atom Probe Tomography

Abstract:

Article Preview

Atom probe tomography provides compositional information in three dimensions at the atomic scale, and is therefore extremely suited to the study of nanocrystalline materials. In this paper we present atom probe results from the investigation of nanocomposite TiSi¬Nx coatings and nanocrystalline Al. We address some of the major challenges associated with the study of nanocrystalline materials, including specimen preparation, visualisation, common artefacts in the data and approaches to quantitative analysis. We also discuss the potential for the technique to relate crystallographic information to the compositional maps.

Info:

Periodical:

Materials Science Forum (Volumes 654-656)

Main Theme:

Edited by:

Jian-Feng Nie and Allan Morton

Pages:

2366-2369

DOI:

10.4028/www.scientific.net/MSF.654-656.2366

Citation:

F. Z. Tang et al., "Challenges Associated with the Characterisation of Nanocrystalline Materials Using Atom Probe Tomography", Materials Science Forum, Vols. 654-656, pp. 2366-2369, 2010

Online since:

June 2010

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.