Relaxation Behavior of Zr Substituted CaCu₃Ti₄O₁₂ Ceramics

Abstract:

The dielectric properties of Zr substituted CaCu₃Ti₄O₁₂ ceramics have been investigated in detail. Grain size decreases with Zr content increasing. The hetero-electrical microstructures of prepared samples have been confirmed by the impedance spectra. The dielectric loss has been improved by Zr doping because of the enhancement of grain boundary resistivity. A Debye-like boundary relaxation behavior has been observed in the temperature range of 220-600K. As Zr content increases, the relaxation time increases due to the higher grain boundary concentration. This work has provided an additional proof for the origin of giant dielectric response in CaCu₃Ti₄O₁₂ ceramics.

• Periodical: Materials Science Forum (Volume 687)
• Pages: 375-379
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.687.375
• Online since: June 2011
• Authors: Hong Tao Yu, Wen Bo Zhang, Jing Song Liu, Han Xing Liu
• Keywords: CaCu₃Ti₄O₁₂ (CCTO), Impedance Spectra, Relaxation Behavior, Zr

References

[1] M.A. Subramanian, D. Li, N. Duan, B.A. Resiner, and A.W. Sleight：J. Solid State Chem. Vol. 151(2000), p.323.

[2] C.C. Homes, T. Vogt, S.M. Shapiro, S. Wakimoto, and A.P. Ramirez, Science Vol. 293(2001), p.673.

[3] S.M. Ke, H.T. Huang, and H.Q. Fan, Appl. Phys. Lett. Vol. 89(2006), p.182904.

[4] H.T. Yu, H.X. Liu, H. Hao, L.L. Guo, C.J. Jin, Z.Y. Yu, and M.H. Cao, Appl. Phys. Lett. Vol. 91( 2007), p.222911.

[5] S.Y. Chung, I.D. Kim, and S.J.L. Kang, Nature Mater. Vol. 3(2004), p.1.

[6] M.H. Cohen, J.B. Neaton, L.X. He, and D. Vanderbilt, J. Appl. Phys. Vol. 94(2003), p.3299.

[7] P. Lunkenheimer, R. Fichtl, S.G. Ebbinghaus, and A. Loidl, Phys. Rev. B Vol. 70(2004), p.172102.

[8] D.C. Sinclair, T.B. Adams, F.D. Morrison and A.R. West, Appl. Phys. Lett. Vol. 80(2002), p.2153.

[9] T.B. Adams, D. C Sinclair and A.R. West, Adv. Mater. Vol. 14(2002), p.1321.

[10] W. Li, R.W. Schwartz, A.P. Chen, and J.S. Zhu, Appl. Phys. Lett. Vol. 92(2007), p.112901.

[11] R.K. Grubbs, E.L. Venturini, P.G. Clem, J.J. Richardson, B.A. Tuttle, and G.A. Samara, Phys. Rew. B Vol. 72(2005), p.104111.

[12] E.A. Patterson, S. Kwon, C.C. Huang, and P. Cann, Appl. Phys. Lett. Vol. 87(2005), p.182911.

[13] T.T. Fang, and H.K. Shiau, J. Am. Ceram. Soc. Vol. 87(2004), p. (2072).

[14] G.H. Cao, L.X. Feng, and C. Wang, J. Phys. D: Appl. Phys. Vol. 40(2007), p.2899.

[15] T.T. Fang, and C.P. Liu, Chem. Mater. Vol. 17(2005), p.5167.

[16] K. Uchino, E. Sadanaga, and T. Hirose, J. Am. Ceram. Soc. Vol. 72(1989), p.1555.

[17] D.C. Sinclair, and A.R. West, J. Appl. Phys. Vol. 66(1989), p.3850.

[18] Y.Y. Yan, L. Jin, L.X. Feng, and G.H. Cao, Mater. Sci. and Eng. B Vol. 130(2006), p.146.