Textured Multiferroics: 2-D Diffraction and Properties Prediction

Alejandro Muñoz-Romero; L. Fuentes-Montero; M.E. Montero-Cabrera; U. Trivedi; Luis E. Fuentes-Cobas

doi:10.4028/www.scientific.net/MSF.702-703.1007

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HomeMaterials Science ForumMaterials Science Forum Vols. 702-703Textured Multiferroics: 2-D Diffraction and...

Textured Multiferroics: 2-D Diffraction and Properties Prediction

Abstract:

A description of recent work performed by collaboration among the CIMAV Crystal Physics Group, the ILL Diffraction Group and the GEC Nanotechnology Education and Research Centre (NERC), regarding structure-electromagnetic properties relationships, is given. Structure analysis puts emphasis on thin films texture characterization. The new software package ANAELU, for texture analysis via two-dimensional (2-D) diffraction detection, is described. Crystallographic texture plays a significant role on ferroic and multiferroic bulk and nano-structured materials properties. With the objective of estimating effective values for polycrystal dielectric, piezoelectric, elastic and magnetoelectric coefficients, the Voigt, Reuss and Hill approximations are systematized in an extended version of program SAMZ.

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Materials Science Forum (Volumes 702-703)

Pages:

1007-1010

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.702-703.1007

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Online since:

December 2011

Authors:

Alejandro Muñoz-Romero, L. Fuentes-Montero, M.E. Montero-Cabrera, U. Trivedi, Luis E. Fuentes-Cobas

Keywords:

2-D Diffraction, Electromagnetic Properties, Multiferroic, Texture

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