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3D-EBSD Studies of Deformation, Recrystallization and Phase Transformations

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Abstract:

A focused ion beam (FIB) coupled with high resolution electron backscatter diffraction (EBSD) has emerged as a useful tool for generating crystallographic information in reasonably large volumes of microstructure. In principle, data generation is reasonably straightforward whereby the FIB is used as a high precision serial sectioning device for generating consecutive milled surfaces suitable for mapping by EBSD. The successive EBSD maps generated by serial sectioning are combined using various post-processing methods to generate crystallographic volumes of the microstructure. This paper provides an overview of the use of 3D-EBSD in the study of various phenomena associated with thermomechanical processing of both crystalline and semi-crystalline alloys and includes investigations on the crystallographic nature of microbands, void formation at particles, phase redistribution during plastic forming, and nucleation of recrystallization within various regions of the deformation microstructure.

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Periodical:

Materials Science Forum (Volumes 715-716)

Pages:

41-50

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.715-716.41

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Online since:

April 2012

Authors:

Michael Ferry, Wan Qiang Xu, M. Zakaria Quadir, Nasima Afrin Zinnia, Kevin J. Laws, Nora Mateescu, Lalu Robin, Lori Bassman, Julie M. Cairney, John F. Humphreys, Adeline Albou, Julian H. Driver

Keywords:

3D-EBSD, Deformation, Focused Ion Beam (FIB), Recrystallization, Serial Sectioning

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© 2012 Trans Tech Publications Ltd. All Rights Reserved

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