Vanadium Oxide Thin Films Synthesized by Reactive Ion Beam Sputter Deposition: Influence of Processing Parameters

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Vanadium oxide thin films were deposited by reactive ion beam sputtering deposition onto glass substrates. The films were prepared by sputtering from a metallic vanadium target with an argon+oxygen ion beam in vacuum. Different processing conditions were evaluated with focus in obtaining monoclinic VO2(M) phase, which is known to exhibit a semiconducting-metal phase transition near room temperature. X-ray diffractometry (XRD) analyses revealed amorphous films for temperatures below 500°C. In crystalline films, the co-existence of VO2(M) with other phases was suppressed by pre-depositing a very thin metallic vanadium seeding layer which showed to promote the formation of single phase VO2(M) films. The VO2(M) films showed clearly the distinctive optical modulation behavior at the near-infrared range when going through the phase transition. The temperature dependence of sheet resistance supports the optical analyses revealing an evident semiconducting-metal behavior change up to over 2 orders of magnitude.

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Materials Science Forum (Volumes 730-732)

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251-256

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November 2012

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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[1] H.W. Verleur, A.S. Barker and C.N. Berglund, Physical Review Vol. 172 (1968), p.788.

Google Scholar

[2] C. Batista, J. Carneiro, R. Ribeiro and V. Teixeira, Journal of Nanoscience and Nanotechnology (2010), p. Accepted.

Google Scholar

[3] C. Batista, R. Ribeiro, J. Carneiro and V. Teixeira, Journal of Nanoscience and Nanotechnology Vol. 9 (2009), p.4220.

Google Scholar

[4] C. Batista, R. Ribeiro and V. Teixeira, Nanoscale Research Letters Vol. 6 (2011), p.301.

Google Scholar

[5] C. Batista, V. Teixeira and R.M. Ribeiro, Journal of Nanoscience and Nanotechnology Vol. 10 (2010), p.1393.

Google Scholar

[6] C.G. Granqvist, Physica Scripta Vol. 32 (1985), p.401.

Google Scholar

[7] C.G. Granqvist, Thin Solid Films Vol. 193-194 (1990), p.730.

Google Scholar

[8] C. Batista, V. Teixeira and J. Carneiro, Journal of Nano Research Vol. 2 (2008), p.21.

Google Scholar

[9] C. Batista, V. Teixeira and R.M. Ribeiro, Materials Technology: Advanced Performance Materials Vol. 26 (2011), p.35.

Google Scholar

[10] K. Okimura and N. Kubo, Thin Solid Films Vol. 515 (2007), p.4992.

Google Scholar

[11] D. Brassard, S. Fourmaux, M. Jean-Jacques, J.C. Kieffer and M.A. El Khakani, Applied Physics Letters Vol. 87 (2005), p.051910.

DOI: 10.1063/1.2001139

Google Scholar

[12] C.H. Griffiths and H.K. Eastwood, Journal of Applied Physics Vol. 45 (1974), p.2201.

Google Scholar

[13] S.B. Wang, S.B. Zhou and X.J. Yi, Vacuum Vol. 75 (2004), p.85.

Google Scholar

[14] J. Li and N. Yuan, Applied Surface Science Vol. 233 (2004), p.252.

Google Scholar

[15] N. Yuan, J. Li, G. Li and X. Chen, Thin Solid Films Vol. 515 (2006), p.1275.

Google Scholar

[16] S. Chen, H. Ma, X. Yi, T. Xiong, H. Wang and C. Ke, Sensors and Actuators A: Physical Vol. 115 (2004), p.28.

Google Scholar

[17] X. Yi, C. Chen, L. Liu, Y. Wang, B. Xiong, H. Wang and S. Chen, Infrared Physics and Technology Vol. 44 (2003), p.137.

Google Scholar

[18] The International Centre for Diffraction Data (ICDD), Powder Diffraction File 31-1438.

Google Scholar

[19] C. Leroux, G. Nihoul and G. Van Tendeloo, Physical Review B Vol. 57 (1998), p.5111.

Google Scholar

[20] The International Centre for Diffraction Data (ICDD), Powder Diffraction File 44-252.

Google Scholar

[21] The International Centre for Diffraction Data (ICDD), Powder Diffraction File 44-253.

Google Scholar

[22] The International Centre for Diffraction Data (ICDD), Powder Diffraction File 41-1426.

Google Scholar

[23] The International Centre for Diffraction Data (ICDD), Powder Diffraction File 45-1074.

Google Scholar

[24] G.B. Smith, G.A. Niklasson, J.S.E.M. Svensson and C.G. Granqvist, J. Appl. Phys. Vol. 59 (1986), p.571.

Google Scholar

[25] J.C. Parker, U.W. Geiser, D.J. Lam, Y. Xu and W.Y. Ching, J. Am. Ceram. Soc. Vol. 73 (1990), p.3206.

Google Scholar

[26] P. Jin, K. Yoshimura and S. Tanemura, Journal of Vacuum Science & Technology A Vol. 15 (1997), p.1113.

Google Scholar

[27] N.R. Mlyuka and R.T. Kivaisi, Journal of Materials Science Vol. 41 (2006), p.5619.

Google Scholar

[28] D. Kucharczyk and T. Niklewski, Journal of Applied Crystallography Vol. 12 (1979), p.370.

Google Scholar

[29] Y. Nihei, Y. Sasakawa and K. Okimura, Thin Solid Films Vol. 516 (2008), p.3572.

Google Scholar

[30] D.H. Kim and H.S. Kwok, Applied Physics Letters Vol. 65 (1994), p.3188.

Google Scholar