Role of Cl/Si Ratio in the Low-Temperature Chloro-Carbon Epitaxial Growth of SiC

Article Preview

Abstract:

In order to understand the influence of the Cl/Si ratio on the morphology of the low-temperature chloro-carbon epitaxial growth, HCl was added during the SiCl4/CH3Cl growth at 1300°C. Use of higher Cl/Si ratio allowed only modest improvements of the growth rate without morphology degradation, which did not go far beyond what has been achieved previously by optimizing the value of the input C/Si ratio. On the other hand, when the epitaxial growth process operated at too low or too high values of the input C/Si ratio, i.e., outside of the window of good epilayer morphology, any additional increase of the Cl/Si ratio caused improvement of the epilayer morphology. It was established that this improvement was due to a change of the effective C/Si ratio towards its intermediate values, which corresponded to more favorable growth conditions.

You might also be interested in these eBooks

Info:

Periodical:

Materials Science Forum (Volumes 740-742)

Pages:

205-208

Citation:

Online since:

January 2013

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2013 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] H. Pedersen, S. Leone, O. Kordina, A. Henry, S. -I. Nishizawa, Y. Koshka and E. Janzén, Chemical Reviews, 2012, 112, 2434–2453.

DOI: 10.1021/cr200257z

Google Scholar

[2] S. Kotamraju, B. Krishnan, G. Melnychuk, and Y. Koshka, Journal of Crystal Growth 312 (2010) pp.645-650.

DOI: 10.1016/j.jcrysgro.2009.12.017

Google Scholar

[3] S. Kotamraju, B. Krishnan, and Y. Koshka, Phys. Status Solidi RRL 4, No. 7, 145-147 (2010).

Google Scholar

[4] G.S. Fischman and W. T. Petuskey, J. Am. Ceram. Soc., 68(4) 185-190 (1985).

Google Scholar