Step Instability in Sublimation Epitaxy on Low Off-Axis 6H-SiC

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Abstract:

The growth of homoepitaxial layers on off-oriented 6H-SiC substrates proceeds via step flow growth. Such epilayers can exhibit irregularities like step bunching, splicing or crossover of steps. The effects of the substrate off-orientation and growth temperature show an influence on formation of surface irregularities. The mean features seem to be given by the growth mode competition of two-dimensional growth to the step-flow growth.

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Materials Science Forum (Volumes 740-742)

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201-204

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January 2013

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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