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Step Instability in Sublimation Epitaxy on Low Off-Axis 6H-SiC
Abstract:
The growth of homoepitaxial layers on off-oriented 6H-SiC substrates proceeds via step flow growth. Such epilayers can exhibit irregularities like step bunching, splicing or crossover of steps. The effects of the substrate off-orientation and growth temperature show an influence on formation of surface irregularities. The mean features seem to be given by the growth mode competition of two-dimensional growth to the step-flow growth.
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201-204
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Online since:
January 2013
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© 2013 Trans Tech Publications Ltd. All Rights Reserved
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