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HomeMaterials Science ForumMaterials Science Forum Vols. 83-87Characterization of GaAs/AlGaAs Heterostructures...

Characterization of GaAs/AlGaAs Heterostructures Grown by OMVPE Using Trimethylamine Alane as a New Aluminum Source

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Defects in Semiconductors 16

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Periodical:

Materials Science Forum (Volumes 83-87)

Pages:

1063-1068

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.83-87.1063

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Online since:

January 1992

Authors:

W.S. Hobson, S.R. McAfee, Kevin S. Jones, N.G. Paroskevopoulos, C.R. Abernathy, S.K. Sputz, T.D. Harris, M. Lamont Schnoes, Stephen J. Pearton

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© 1992 Trans Tech Publications Ltd. All Rights Reserved

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