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Atomic Defect Configurations Identified by Nuclear Techniques
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Combination of Deep Level Transient Spectroscopy and Transmutation of Radioactive Impurities
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HomeMaterials Science ForumMaterials Science Forum Vols. 83-87Defects in MCZ Silicon with Various Oxygen and...

Defects in MCZ Silicon with Various Oxygen and Carbon Contents

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Defects in Semiconductors 16

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Periodical:

Materials Science Forum (Volumes 83-87)

Pages:

1075-1080

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.83-87.1075

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Online since:

January 1992

Authors:

E.P. Bochkarev, S.N. Gorin, G.N. Petrov, T.M. Tkacheva

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© 1992 Trans Tech Publications Ltd. All Rights Reserved

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