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HomeMaterials Science ForumMaterials Science Forum Vols. 83-87Identification of Band Gap States in Silicon by...

Identification of Band Gap States in Silicon by Deep Level Transient Spectroscopy on Radioactive Impurities

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Defects in Semiconductors 16

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Periodical:

Materials Science Forum (Volumes 83-87)

Pages:

1103-1108

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.83-87.1103

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Online since:

January 1992

Authors:

J.W. Petersen, Jacob Nielsen

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© 1992 Trans Tech Publications Ltd. All Rights Reserved

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