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Modern Muon Spectroscopic Methods in Semiconductor Physics
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Muon Stopping Sites in Semiconductors from Decay-Positron Channeling
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Polarized Spectroscopy of Complex Luminescence Centers
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HomeMaterials Science ForumMaterials Science Forum Vols. 83-87Modern Muon Spectroscopic Methods in Semiconductor...

Modern Muon Spectroscopic Methods in Semiconductor Physics

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Defects in Semiconductors 16

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Periodical:

Materials Science Forum (Volumes 83-87)

Pages:

1115-1120

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.83-87.1115

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Online since:

January 1992

Authors:

R.L. Lichti, C.D. Lamp, S.R. Kreitzman, R.F. Kiefl, J.W. Schneider, Ch. Niedermayer, K. Chow, T. Pfiz, T.L. Estle, S.A. Dodds, B. Hitti, R.C. Duvarney

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© 1992 Trans Tech Publications Ltd. All Rights Reserved

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