Spin-Marking Method in Silicon: Interstitial and Pairing Defects

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Periodical:

Materials Science Forum (Volumes 83-87)

Edited by:

Gordon Davies, G.G. DeLeo and M. Stavola

Pages:

363-368

DOI:

10.4028/www.scientific.net/MSF.83-87.363

Citation:

S.M. Yakubenya "Spin-Marking Method in Silicon: Interstitial and Pairing Defects", Materials Science Forum, Vols. 83-87, pp. 363-368, 1992

Online since:

January 1992

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$35.00

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