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Spin-Marking Method in Silicon: Interstitial and Pairing Defects
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HomeMaterials Science ForumMaterials Science Forum Vols. 83-87ODMR and Electron Spin Echo Studies on the...

ODMR and Electron Spin Echo Studies on the Non-Radiative Triplet State of the (V-O)° Defect in Silicon

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Defects in Semiconductors 16

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Periodical:

Materials Science Forum (Volumes 83-87)

Pages:

357-362

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.83-87.357

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Online since:

January 1992

Authors:

A.M. Frens, J. Schmidt, W.M. Chen, Bo Monemar

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© 1992 Trans Tech Publications Ltd. All Rights Reserved

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