Lateral Inhomogeneity of Critical Current of HTS Conductor Using Hall Sensor Array

Yun Peng Zhu; Xin Sheng Yang; Yong Zhao

doi:10.4028/www.scientific.net/MSF.848.763

Paper Titles

Effect of Modified NanoSiO₂ Agents on the Morphologies and Performances of UHMWPE Microporous Membrane via Thermally Induced Phase Separation
p.726

Structure and Performance of PP Porous Membrane Prepared with Adipic Acid and NA-40 as Nucleating Agent via TIPS
p.733

Effects of Pyrolysis Temperature on the Properties of Phenol-Formaldehyde Resin Based Carbon Molecular Sieve Membrane
p.738

Random Lasers with Coherent Feedback from Polymer Films Based on Rh6G-PVP
p.743

Progress on the Applications of Piezoelectric Materials in Sensors
p.749

Viscoelastic and Morphological Behavior of Stearic Acid Layer on Top of Polystyrene as Immobilisation Matrix for QCM Sensor
p.757

Lateral Inhomogeneity of Critical Current of HTS Conductor Using Hall Sensor Array
p.763

Effect of Heat-Treatment on the Microstructure and Properties of SiO₂-TiO₂ Aerogels Synthesized via Supercritical Drying
p.770

In-Plane Strain Field Sensor Based on the Semiconductor Film
p.777

HomeMaterials Science ForumMaterials Science Forum Vol. 848Lateral Inhomogeneity of Critical Current of HTS...

Lateral Inhomogeneity of Critical Current of HTS Conductor Using Hall Sensor Array

Abstract:

A reel-to-reel Hall sensor array system was build and an inverse operation algorithm was applied to obtain the lateral distribution of critical current density by the remanent field around the superconducting tape. Simulation analysis was conducted to verify the validity of the algorithm. Commercial YBCO and Bi2223 tape and YBCO tape with artificial defects were measured. The standard deviation of lateral critical current density on the cross section of conductor was used as a parameter describing the lateral inhomogeneity of critical current density. The result shows that this measurement method is a stable and efficient way to evaluate the lateral inhomogeneity of critical current of high temperature tapes.

You might also be interested in these eBooks

Functional and Functionally Structured Materials

View Preview

Info:

Periodical:

Materials Science Forum (Volume 848)

Pages:

763-769

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.848.763

Citation:

Cite this paper

Online since:

March 2016

Authors:

Yun Peng Zhu, Xin Sheng Yang, Yong Zhao

Keywords:

Hall Array Sensor, HTS Tape, Lateral Critical Current Density Distribution

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

References

[1] P. Usak, The measurement of current distribution in superconducting tape Comparison of destructive and non-destructive methods, Physica C. 384 (2003) 93-101.

Google Scholar

[2] P. Usak, M. Polak, P. Mozola, Measurement of the Lateral Transport Current Distribution in YBCO Tape , IEEE Trans. Appl. Supercond. 19(3) (2009) 2839-2842.

DOI: 10.1109/tasc.2009.2018851

Google Scholar

[3] M. Carrera, J. Amoros, X. Granados, R. Maynou, T. Puig and X. Obradors, Computation of Current Distribution in YBCO Tapes With Defects Obtained From Hall Magnetic Mapping by Inverse Problem Solution, IEEE Trans. Appl. Supercond. 21(3) (2011).

DOI: 10.1109/tasc.2010.2089596

Google Scholar

[4] K. Shiohara, K. Higashikawa, M. Inoue, T. Kiss, Y. Iijima, T. Saitoh, M. Yoshizumi and T. Izumi. Measurement of in-plane magnetic relaxation in RE-123 coated conductors by use of scanning Hall probe microscopy, Physica C. 484 (2013) 139-141.

DOI: 10.1016/j.physc.2012.03.067

Google Scholar

[5] G. Grimaldi, M. Bauer, H. Kinder, Continuous reel-to-reel measurement of critical currents of coated conductors, Appl. Phys. Lett. 79 (2001) 4390.

DOI: 10.1063/1.1428771

Google Scholar

[6] Y. Wang, Y. Lu, X. Xu, S. Dai, D. Hui, L. Xiao and L. Lin, Detecting and describing the inhomogeneity of critical current in practical long HTS tapes using contact-free method, Cryogenics. 47 (2007) 225-231.

DOI: 10.1016/j.cryogenics.2007.01.006

Google Scholar

[7] H. Kim, S. Oh, N. Lee, S. Baik, D. Ha, R. Ko, H. Ha, T. Kim, D. Youm, S. Moon and C. Park, Nondestructive Measurement of Critical Current Distribution of SmBCO Coated Conductor Using Hall Probe, IEEE Trans. Appl. Supercond. 20(3) (2010) 1537-1540.

DOI: 10.1109/tasc.2009.2039205

Google Scholar