Light Trapping in Monocrystalline Si Solar Cells Using Back–Side Diffraction Gratings

Ralph Rothemund; Thomas Umundum; Gerald Meinhardt; Kurt Hingerl; Thomas Fromherz; Wolfgang Jantsch

doi:10.4028/www.scientific.net/SSP.178-179.446

Paper Titles

Low-Temperature Diffusion of Transition Metals at the Presence of Radiation Defects in Silicon
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Analysis of Auger Recombination Characteristics in High Resistivity Si and Ge
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Studying Light Soaking of Solar Cells by the Use of Solar Simulator
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Implementation of Highly Resistive Emitter Solar Cells in a Production Environment using an Inline Doping System
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Light Trapping in Monocrystalline Si Solar Cells Using Back–Side Diffraction Gratings
p.446

Visible Light-Emitting Hydrogenated Nanocrystalline Silicon-on-Insulator Films: Formation and Properties
p.453

Defect Engineering in 2D Photonic Crystals Fabricated by Electrochemical Etching of Silicon
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Photocurrent and Photoluminescence of Amorphous Silicon Nanoclusters Embedded in Silicon Suboxide Matrix
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Bistable Defects as the Cause for NBTI and RTN
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HomeSolid State PhenomenaSolid State Phenomena Vols. 178-179Light Trapping in Monocrystalline Si Solar Cells...

Light Trapping in Monocrystalline Si Solar Cells Using Back–Side Diffraction Gratings

Abstract:

Back–side diffraction gratings enhance a solar cell’s near–band–gap response by diffracting light into higher orders and thereby reducing front–side escape losses. The resulting increased photon absorption and carrier generation improves short–circuit current densities and solar cell efficiencies. Combining rigorous coupled–wave analysis and ray tracing yields a three–dimensional, polarization sensitive optical model to calculate Si absorbance, front–side and back–side losses. For industrially used, pyramidally textured, 180 μm Si solar cells with 85 nm SiN_x anti–reflection coating, the application of an optimized back–side grating enhances the short–circuit current density by ≈ +1 mA/cm², a relative increase of ≈ +2.7 %.

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Periodical:

Solid State Phenomena (Volumes 178-179)

Pages:

446-450

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.178-179.446

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Online since:

August 2011

Authors:

Ralph Rothemund, Thomas Umundum, Gerald Meinhardt, Kurt Hingerl, Thomas Fromherz, Wolfgang Jantsch

Keywords:

Diffraction Grating, Light Trapping, Ray-Tracing, RCWA, Rigorous Coupled Wave Analysis, Silicon Solar Cell, Solar Cell Modelling

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