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HomeSolid State PhenomenaSolid State Phenomena Vols. 47-48Relation between Structural and Carrier...

Relation between Structural and Carrier Recombination Properties in As-Rich GaAs

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Gettering and Defect Engineering in Semiconductor Technology VI

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Periodical:

Solid State Phenomena (Volumes 47-48)

Pages:

443-448

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.47-48.443

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Online since:

July 1995

Authors:

V. Jasutis, D. Lescinskas, Stanislovas Marcinkevičius, K. Bertulis, A. Krotkus, H.H. Tan, C. Jagadish

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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