Ion Beam Sputter Deposited Si0.8Ge0.2Epilayers: Lattice Defects and Surface Topology

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Periodical:

Solid State Phenomena (Volumes 47-48)

Edited by:

H. Richter, M. Kittler and C. Claeys

Pages:

431-436

DOI:

10.4028/www.scientific.net/SSP.47-48.431

Citation:

V. Demuth et al., "Ion Beam Sputter Deposited Si0.8Ge0.2Epilayers: Lattice Defects and Surface Topology", Solid State Phenomena, Vols. 47-48, pp. 431-436, 1996

Online since:

July 1995

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$35.00

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