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HomeSolid State PhenomenaSolid State Phenomena Vols. 47-48Measurements of Diffusion Length in Si-SiGe...

Measurements of Diffusion Length in Si-SiGe Structures

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Gettering and Defect Engineering in Semiconductor Technology VI

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Periodical:

Solid State Phenomena (Volumes 47-48)

Pages:

601-606

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.47-48.601

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Online since:

July 1995

Authors:

O.V. Kononchuk, George A. Rozgonyi, Eugene B. Yakimov

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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