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HomeSolid State PhenomenaSolid State Phenomena Vols. 47-48Determination of Subgap-Asorption in μc-Si:H Films...

Determination of Subgap-Asorption in μc-Si:H Films by CPM

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Gettering and Defect Engineering in Semiconductor Technology VI

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Periodical:

Solid State Phenomena (Volumes 47-48)

Pages:

607-612

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.47-48.607

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Online since:

July 1995

Authors:

R. Krankenhagen, M. Schmidt, W. Henrion, Irina Sieber, S. Koynov, S. Grebner, R. Schwarz

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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