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HomeSolid State PhenomenaSolid State Phenomena Vols. 67-68Properties of Transparent Conducting Indium Tin...

Properties of Transparent Conducting Indium Tin Oxide Films Deposited by Reactive e-Beam Evaporation on Heated Glass

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Polycrystalline Semiconductors V

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Periodical:

Solid State Phenomena (Volumes 67-68)

Pages:

249-254

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.67-68.249

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Online since:

April 1999

Authors:

G. Sinno, C. Minarini, S. Loreti, G. Di Francia, A. Salluzzo

Keywords:

e-Beam, Hall Mobility, Inductively Coupled Plasma-Mass Spectroscopy, X-Ray Diffraction (XRD)

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© 1999 Trans Tech Publications Ltd. All Rights Reserved

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