Modeling the Influence of Dislocations on Minority Carrier Diffusion Length in Silicon as a Function of Dislocation Contamination
p.253
p.253
Defect Characterization in Multicrystalline Silicon Using Scanning Techniques
p.259
p.259
Minority Carrier Lifetime Scan Maps Applied to Metallic Impurity Detection in Silicon Wafers
p.267
p.267
Surface Concentration Dependence of Diffusion Profile Shape for Phosphorus in Si
p.275
p.275
Rapid Diffusion of Titanium along Grain Boundaries in Polysilicon during Electron Beam Evaporation
p.281
p.281
EBIC/XPS Study of the Antimony Equilibrium Segregation at Germanium Surface
p.289
p.289
Luminescence Studies on InxGa1-xN/GaN Multiple Quantum Wells by Selective Excitation Spectroscopy
p.297
p.297
Cathodoluminescence of the Composite Nanoscale Dendrite - Like GaAs-Ge Epitaxial Heterostructure
p.301
p.301
SEM-Motion Picture System Observation of Moving High-Field Domains in Semi-Insulating GaAs
p.307
p.307
Rapid Diffusion of Titanium along Grain Boundaries in Polysilicon during Electron Beam Evaporation
Abstract:
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Periodical:
Solid State Phenomena (Volumes 78-79)
Pages:
281-288
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Online since:
April 2001
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© 2001 Trans Tech Publications Ltd. All Rights Reserved
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