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HomeSolid State PhenomenaSolid State Phenomena Vols. 78-79Defect Characterization in Multicrystalline...

Defect Characterization in Multicrystalline Silicon Using Scanning Techniques

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Periodical:

Solid State Phenomena (Volumes 78-79)

Pages:

259-266

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.78-79.259

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Online since:

April 2001

Authors:

Sergei S. Ostapenko, I. Tarasov, Juris P. Kalejs

Keywords:

Defect, Dislocation, Lifetime, Photoluminescence (PL), Silicon

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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