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HomeSolid State PhenomenaSolid State Phenomena Vols. 78-79A System for Ultra-Fast Transient Ion and Pulsed...

A System for Ultra-Fast Transient Ion and Pulsed Laser Current Microscopies as a Function of Temperature

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Beam Injection Assessment of Microstructures in Semiconductors

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Periodical:

Solid State Phenomena (Volumes 78-79)

Pages:

401-406

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.78-79.401

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Online since:

April 2001

Authors:

Jamie Steward Laird, Toshio Hirao, S. Onoda, H. Mori, Hisayoshi Itoh

Keywords:

Charge Collection, Cryogenic Stage, Scanning Ion Deep Level Transient Spectroscopy, Single Event Upset, Transient Ion Beam Induced Current, Transient Laser Beam Induced Current

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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