A System for Ultra-Fast Transient Ion and Pulsed Laser Current Microscopies as a Function of Temperature

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Periodical:

Solid State Phenomena (Volumes 78-79)

Edited by:

H. Tomokage and T. Sekiguchi

Pages:

401-406

DOI:

10.4028/www.scientific.net/SSP.78-79.401

Citation:

J. S. Laird et al., "A System for Ultra-Fast Transient Ion and Pulsed Laser Current Microscopies as a Function of Temperature", Solid State Phenomena, Vols. 78-79, pp. 401-406, 2001

Online since:

April 2001

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$35.00

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