Raman Spectroscopy of Ultra-Heavily Doped Laser-Crystallized Polycrystalline Silicon Films

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Periodical:

Solid State Phenomena (Volumes 80-81)

Edited by:

O. Bonnaud, T. Mohammed-Brahim, H.P. Strunk and J.H. Werner

Pages:

193-198

DOI:

10.4028/www.scientific.net/SSP.80-81.193

Citation:

N.H. Nickel et al., "Raman Spectroscopy of Ultra-Heavily Doped Laser-Crystallized Polycrystalline Silicon Films", Solid State Phenomena, Vols. 80-81, pp. 193-198, 2001

Online since:

November 2001

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$35.00

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