Paper Titles

Numerical Modeling and Simulation of Output Parameters in Poly-Si Homojunction nip (or pin) Solar Cells
p.317

Polycrystalline Silicon Thin-Film Transistors
p.325

Single-Crystalline Regions of Silicon-on-Glass for Thin-Film Transistors
p.337

Correlation between the Ageing and the Grain Size of Polysilicon Thin-Film Transistors
p.343

Analysis of Hot Carrier Effect in Low-Temperature Poly-Si Thin-Film Transistors towards High Reliability
p.349

Low-Temperature Plasma-Processed Microcrystalline Silicon Thin Films for Large-Area Electronics
p.361

Electrical and Noise Characterization of Large-Grain Polycrystalline Silicon Thin-Film Transistors
p.367

Accumulation Mode in Polycrystalline Silicon Thin-Film Transistors
p.373

Simulation of the Backward Current in Polycrystalline Silicon Thin-Film Transistors
p.379

HomeSolid State PhenomenaSolid State Phenomena Vols. 80-81Analysis of Hot Carrier Effect in Low-Temperature...

Analysis of Hot Carrier Effect in Low-Temperature Poly-Si Thin-Film Transistors towards High Reliability

Article Preview

Abstract:

You might also be interested in these eBooks

Polycrystalline Semiconductors VI

Info:

Periodical:

Solid State Phenomena (Volumes 80-81)

Pages:

349-360

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.80-81.349

Citation:

Cite this paper

Online since:

November 2001

Authors:

Takashi Fuyuki, Yukiharu Uraoka

Keywords:

DC Stress, Density of States (DOS), Dynamic Stress, Hot Carriers, Low-Temperature Poly-Silicon (LTPS), Photon Emission, System on Panel

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2001 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: