Analysis of Hot Carrier Effect in Low-Temperature Poly-Si Thin-Film Transistors towards High Reliability

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Periodical:

Solid State Phenomena (Volumes 80-81)

Edited by:

O. Bonnaud, T. Mohammed-Brahim, H.P. Strunk and J.H. Werner

Pages:

349-360

DOI:

10.4028/www.scientific.net/SSP.80-81.349

Citation:

T. Fuyuki and Y. Uraoka, "Analysis of Hot Carrier Effect in Low-Temperature Poly-Si Thin-Film Transistors towards High Reliability", Solid State Phenomena, Vols. 80-81, pp. 349-360, 2001

Online since:

November 2001

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$35.00

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