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HomeSolid State PhenomenaSolid State Phenomena Vols. 80-81Electrical and Noise Characterization of...

Electrical and Noise Characterization of Large-Grain Polycrystalline Silicon Thin-Film Transistors

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Periodical:

Solid State Phenomena (Volumes 80-81)

Pages:

367-372

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.80-81.367

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Online since:

November 2001

Authors:

F.V. Farmakis, D.M. Tsamados, J. Brini, G. Kamarinos, C.A. Dimitriadis

Keywords:

Large Grain Polysilicon, Low-Frequency Noise, On-Current Modeling, Polycrystalline, Thin Film Transistor

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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