Simulation of the Backward Current in Polycrystalline Silicon Thin-Film Transistors

Abstract:

Article Preview

Info:

Periodical:

Solid State Phenomena (Volumes 80-81)

Edited by:

O. Bonnaud, T. Mohammed-Brahim, H.P. Strunk and J.H. Werner

Pages:

379-384

DOI:

10.4028/www.scientific.net/SSP.80-81.379

Citation:

M. Baudet et al., "Simulation of the Backward Current in Polycrystalline Silicon Thin-Film Transistors", Solid State Phenomena, Vols. 80-81, pp. 379-384, 2001

Online since:

November 2001

Keywords:

Export:

Price:

$35.00

In order to see related information, you need to Login.