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HomeSolid State PhenomenaSolid State Phenomena Vols. 80-81Accumulation Mode in Polycrystalline Silicon...

Accumulation Mode in Polycrystalline Silicon Thin-Film Transistors

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Polycrystalline Semiconductors VI

Info:

Periodical:

Solid State Phenomena (Volumes 80-81)

Pages:

373-378

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.80-81.373

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Online since:

November 2001

Authors:

Y. Bourezig, H. Sehil, Baya Zebentout, Z. Benamara, F. Raoult, O. Bonnaud

Keywords:

Grain Boundary, Polycrystalline Silicon, Poole-Frenkel Effect, Simulation, Thin Film Transistor

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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