Properties of Polycrystalline Cu2O Thin-Films Doped with N or Si as an Acceptor Dopant

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Periodical:

Solid State Phenomena (Volume 93)

Edited by:

T. Fuyuki, T. Sameshima, H.P. Strunk and J.H. Werner

Pages:

313-318

DOI:

10.4028/www.scientific.net/SSP.93.313

Citation:

S. Ishizuka et al., "Properties of Polycrystalline Cu2O Thin-Films Doped with N or Si as an Acceptor Dopant ", Solid State Phenomena, Vol. 93, pp. 313-318, 2003

Online since:

June 2003

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$35.00

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