Carrier Density Imaging as a Tool for Characterising the Electrical Activity of Defects in Pre-Processed Multicrystalline Silicon

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Periodical:

Solid State Phenomena (Volumes 95-96)

Edited by:

H. Richter and M. Kittler

Pages:

229-234

DOI:

10.4028/www.scientific.net/SSP.95-96.229

Citation:

S. Riepe et al., "Carrier Density Imaging as a Tool for Characterising the Electrical Activity of Defects in Pre-Processed Multicrystalline Silicon", Solid State Phenomena, Vols. 95-96, pp. 229-234, 2004

Online since:

September 2003

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$35.00

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