Impact of Defects on the Leakage Currents of Si/SiGe/Si Heterojunction Bipolar Transistors

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Periodical:

Solid State Phenomena (Volumes 95-96)

Edited by:

H. Richter and M. Kittler

Pages:

249-254

DOI:

10.4028/www.scientific.net/SSP.95-96.249

Citation:

D. Wolansky et al., "Impact of Defects on the Leakage Currents of Si/SiGe/Si Heterojunction Bipolar Transistors", Solid State Phenomena, Vols. 95-96, pp. 249-254, 2004

Online since:

September 2003

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$35.00

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