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Understanding and Reducing the Boron-Oxygen-Related Performance Degradation in Czochralski Silicon Solar Cells
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Carrier Density Imaging as a Tool for Characterising the Electrical Activity of Defects in Pre-Processed Multicrystalline Silicon
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HomeSolid State PhenomenaSolid State Phenomena Vols. 95-96Understanding and Reducing the...

Understanding and Reducing the Boron-Oxygen-Related Performance Degradation in Czochralski Silicon Solar Cells

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Gettering and Defect Engineering in Semiconductor Technology X

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Periodical:

Solid State Phenomena (Volumes 95-96)

Pages:

223-228

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.95-96.223

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Online since:

September 2003

Authors:

Karsten Bothe, Rudolf Hezel, Jan Schmidt

Keywords:

Carrier Lifetime, Czochralski, Defect, Degradation, Metastability, Silicon, Solar Cell

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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