Estimation of the Upper Limit of the Minority-Carrier Diffusion Length in Multicrystalline Silicon: Limitation of the Action of Gettering and Passivation on Dislocations

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Periodical:

Solid State Phenomena (Volumes 95-96)

Edited by:

H. Richter and M. Kittler

Pages:

197-204

DOI:

10.4028/www.scientific.net/SSP.95-96.197

Citation:

M. Kittler and W. Seifert, "Estimation of the Upper Limit of the Minority-Carrier Diffusion Length in Multicrystalline Silicon: Limitation of the Action of Gettering and Passivation on Dislocations", Solid State Phenomena, Vols. 95-96, pp. 197-204, 2004

Online since:

September 2003

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$35.00

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