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HomeSolid State PhenomenaSolid State Phenomena Vols. 95-96Estimation of the Upper Limit of the...

Estimation of the Upper Limit of the Minority-Carrier Diffusion Length in Multicrystalline Silicon: Limitation of the Action of Gettering and Passivation on Dislocations

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Periodical:

Solid State Phenomena (Volumes 95-96)

Pages:

197-204

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.95-96.197

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Online since:

September 2003

Authors:

Martin Kittler, Winfried Seifert

Keywords:

Diffusion Length, Dislocation, DLTS, EBIC, Gettering, Hydrogen Passivation, Multicrystalline Silicon

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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