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HomeSolid State PhenomenaSolid State Phenomena Vols. 95-96Capacitance-Transient Detection of X-Ray...

Capacitance-Transient Detection of X-Ray Absorption Fine Structure: A Possible Tool to Analyze the Structure of Deep-Level Centers?

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Periodical:

Solid State Phenomena (Volumes 95-96)

Pages:

483-488

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.95-96.483

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Online since:

September 2003

Authors:

Joerg Weber, J. Bollmann, S. Knack, V. Kotestki, H.E. Mahnke, E. Welter

Keywords:

Capacitance-Transients, Site-Selectivity, XAFS

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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