Capacitance-Transient Detection of X-Ray Absorption Fine Structure: A Possible Tool to Analyze the Structure of Deep-Level Centers?

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Periodical:

Solid State Phenomena (Volumes 95-96)

Edited by:

H. Richter and M. Kittler

Pages:

483-488

DOI:

10.4028/www.scientific.net/SSP.95-96.483

Citation:

J. Weber et al., "Capacitance-Transient Detection of X-Ray Absorption Fine Structure: A Possible Tool to Analyze the Structure of Deep-Level Centers?", Solid State Phenomena, Vols. 95-96, pp. 483-488, 2004

Online since:

September 2003

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$35.00

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