Gold Diffusion as a Tool for Defect Characterization in Si

Abstract:

Article Preview

Info:

Periodical:

Solid State Phenomena (Volumes 95-96)

Edited by:

H. Richter and M. Kittler

Pages:

495-500

DOI:

10.4028/www.scientific.net/SSP.95-96.495

Citation:

O. V. Feklisova and E. B. Yakimov, "Gold Diffusion as a Tool for Defect Characterization in Si", Solid State Phenomena, Vols. 95-96, pp. 495-500, 2004

Online since:

September 2003

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.