Residual Stress Distribution and Silicon Phase Transformation Induced by Rockwell Indentation at Different Temperatures, Studied by Means of Micro-Raman Spectroscopy

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Periodical:

Solid State Phenomena (Volumes 95-96)

Edited by:

H. Richter and M. Kittler

Pages:

513-518

DOI:

10.4028/www.scientific.net/SSP.95-96.513

Citation:

S. Kouteva-Arguirova et al., "Residual Stress Distribution and Silicon Phase Transformation Induced by Rockwell Indentation at Different Temperatures, Studied by Means of Micro-Raman Spectroscopy", Solid State Phenomena, Vols. 95-96, pp. 513-518, 2004

Online since:

September 2003

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$35.00

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