Gettering Strategies for SOI Wafers

Article Preview

Abstract:

You might also be interested in these eBooks

Info:

Periodical:

Solid State Phenomena (Volumes 95-96)

Pages:

547-552

Citation:

Online since:

September 2003

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2004 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] A. Atkinson, J.W. Gardner, Corrosion Science 21 (1981) 49.

Google Scholar

[2] D.A. Ramappa, W.B. Henley, J. Electrochem. Soc. 146 (1999) 3773.

Google Scholar

[3] O. Kononchuk, K.G. Korablev, N. Yarykin, G.A. Rozgonyi, Appl. Phys. Lett. 73 (1998) 1206.

Google Scholar

[4] T. Yoshimi, M.B. Shabani, S. Okuuchi, H. Abe, in: P. Rai-Choudhury, J.L. Benton, D.K. Schroder, T.J. Shaffner (eds.), Diagnostic Techniques for Semiconductor Materials and Devices, (The Electrochem. Soc., Pennington, 1997), 452.

Google Scholar

[5] A.R. Smith, R.J. McDonald, H. Manini, D.L. Hurley, E.B. Norman, M.C. Vella, R.W. Odom, J. Electrochem. Soc. 143 (1996) 339.

Google Scholar

[6] SiWEDS, www.siweds.org

Google Scholar

[7] H. Hieslmair, S. Balasubramanian, A.A. Istratov, E.R. Weber, Semicond. Sci. Technol. 15 (2001) 567.

Google Scholar

[8] H. Hieslmair, S.A. McHugo, A.A. Istratov, E.R. Weber, in: R. Hull (ed.), Properties of Crystalline Silicon, (INSPEC, Short Run Press, Exeter, 1999), p.775.

Google Scholar

[9] A.A. Istratov, W. Huber, E.R. Weber, J. Electrochem. Soc. 150 (2003) G244.

Google Scholar

[10] R. Hoelzl, K.J. Range, L. Fabry, J. Hage, V. Raineri, Mater. Sci. Eng. B 73 (2000) 95.

Google Scholar