Structural and Catalytic Properties of Thin Films of CuOx-CeO2-x Deposited by Laser Ablation
The structural analysis of thin cerium dioxide films doped with Cu, produced by laser ablation for applications in catalytic and gas sensors, was the general aim of the study. The thin films deposited on a (100) silicon substrate were nanocrystalline structure with a well-developed texture. The morphology, as well as the preferred films orientation, is changed with the volume fraction of Cu. The observed changes affect the catalytic properties of the materials obtained which was confirmed by the catalytic tests undertaken with CH4.
Witold Lojkowski and John R. Blizzard
M. Chmielowska et al., "Structural and Catalytic Properties of Thin Films of CuOx-CeO2-x Deposited by Laser Ablation", Solid State Phenomena, Vols. 99-100, pp. 235-238, 2004