Structural and Catalytic Properties of Thin Films of CuOx-CeO2-x Deposited by Laser Ablation

Abstract:

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The structural analysis of thin cerium dioxide films doped with Cu, produced by laser ablation for applications in catalytic and gas sensors, was the general aim of the study. The thin films deposited on a (100) silicon substrate were nanocrystalline structure with a well-developed texture. The morphology, as well as the preferred films orientation, is changed with the volume fraction of Cu. The observed changes affect the catalytic properties of the materials obtained which was confirmed by the catalytic tests undertaken with CH4.

Info:

Periodical:

Solid State Phenomena (Volumes 99-100)

Edited by:

Witold Lojkowski and John R. Blizzard

Pages:

235-238

DOI:

10.4028/www.scientific.net/SSP.99-100.235

Citation:

M. Chmielowska et al., "Structural and Catalytic Properties of Thin Films of CuOx-CeO2-x Deposited by Laser Ablation", Solid State Phenomena, Vols. 99-100, pp. 235-238, 2004

Online since:

July 2004

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Price:

$35.00

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