Structure and Electrical Properties of Nanocrystalline CdS0.2 Se0.8 Films Sputtered on Substrates with a Silver Sublayer
The paper presents the study of CdS0.2Se0.8 n-type films 0.50-0.65 µm thick manufactured by the RF sputtering technique and their electro-optical properties. The effects of the substrate texturing on the structure and properties of the films are discussed. Recrystallization of the films sputtered onto glass substrates coated with a continuous or island-like silver sublayer resulted in the formation of a nanosized grain structure with higher photosensivity than films deposited onto aluminium oxide ceramics.
Witold Lojkowski and John R. Blizzard
A.K. Fedotov et al., "Structure and Electrical Properties of Nanocrystalline CdS0.2 Se0.8 Films Sputtered on Substrates with a Silver Sublayer", Solid State Phenomena, Vols. 99-100, pp. 239-242, 2004