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By comparing the diffraction spectra with the JCPDS card (No.41-1105) for Y2O3 and the JCPDS card (No.81-2218) for (Gd0.745Y1.255)O3, we found the diffraction peaks just shifted slightly and no other intermediate peaks were detected, indicating the precursor powders sintered at 700℃ have transformed into pure (Y0.97-xGdxEu0.03) 2O3 polycrystalline phase, and the slight peak shifts should be due to the doping of Eu3 + and the changing of Y, Gd ratio.
For the Eu3+ doped (Y, Gd)2O3 polycrystalline, Eu3+ would replace Y3+ and the chances to enter the two sites are equal, then the number of the Eu3 + at C2 sites is higher than those at the sites of C3i [14].
The peaks at longer wave number region (>300nm) were characterized as the f-f transitions within Eu3+ 4f6 configuration.

XRD pattern of ZnO thin film with JCPDS card data, (b) VESTA structure of ZnO on Si substrate, (c) XRD pattern of MoS2/ZnO thin film heterostructure and (d) VESTA structure of MoS2/ZnO thin film heterostructure on Si substrate.
In Fig. 2(a) the ZnO pattern shows well-defined peaks of (100), (101), and (103) planes, matching with Joint Committee on Powder Diffraction Standards (JCPDS) card number (01-075-1533) from the X’pert Highscore database [19].
X’pert Highscore databases (JCPDS # 01–075-1533 and JCPDS # 01–074-0932) match with the XRD data of ZnO and MoS2, respectively.
XRD pattern of Sulphur source with matched JCPDS card.
Fig. 3 shows the XRD pattern of the Sulphur source used in the sulphurization technique for MoS2 formation, which matches with the JCPDS card # 00-024-0733 having a crystal structure of orthorhombic via X’pert High score database.

Results and discussion Fig. 1 shows the XRD patterns of the Tm3+/Ho3+/Yb3+ co-doped YVO4 phosphor (a) and it agrees well with the JCPDS Card No. 17-0341 (b), indicating that the crystal structure of YVO4 has no obvious changes after co-doping Tm3+/Ho3+/Yb3+ ions.
Fig. 1 XRD patterns of (a) the standard data of YVO4 (JCPDS No.17-0341), (b) YVO4:Tm3+,Ho3+,Yb3+ Fig. 2 shows the UC luminescence spectra at the visible range for samples I, II, III.
Fig. 2 UC emission spectrum of the YVO4 powders doped with Tm3+:Ho3+:Yb3+ under infrared laser excitation It is well-known that the emission intensity (If) will be proportional to some power (n) of the infrared excitation power (P) [7]: (1) where n is the number of photons required to populate the emitting state.

Finally, a large number of Al-6TiB2 precursors were prepared, and they were cut by a sawing machine for subsequent experiments.
It is due to the introduction of TiB2 particles that provides a large number of nucleation particles which changes the solidification mode of the melt into the barrel, and suppresses the coarsening of pre-crystallized dendrites on the barrel wall.
Fig. 3 shows the X-ray diffraction pattern of HPDC of the AlSi10MnMg-xTiB2 alloys (x= 0, 0.006, 0.018, and 0.03 wt.%) which is made up of Al (JCPDS card 85-1327), Si (JCPDS card 75-0589), Mg2Si (JCPDS card 75-0445), Mn6Si (JCPDS card 18-0812), and Al2FeSi (JCPDS card 51-0872).
This number is closely related to the value of α-Al [41].

After pre-sintering at 200℃ for 4 h, monoclinic BiVO4 (JCPDS card No: 14-0688), tetragonal scheelite BiVO4 phase (JCPDS card No: 75-2481) exist.
In this study, the phase transformation between monoclinic scheelite and tetragonal scheelite is is at 300℃ as shown in figure 2. 2θ/° JCPDS No.14-0688 JCPDS No.75-2481 (a) 200℃, (b) 250℃, (c) 300℃, (d) 350℃, (e) 400℃, (f) 450℃, (g) 500℃, (h) 550℃ Fig. 1 XRD patterns of BiVO4 (at different calcined temperature for 4h) Figure 2 shows Infrared spectra of dry gel and ashed gel.
The wave number of 3440cm-1 and 1637cm-1 is respectively the broad of peak stretching vibration and bending vibration of O-H.

In Fig. 1(a, b, c), all the diffraction peaks can be indexed to wurtzite ZnO with lattice constants of a=3.24 Å and c=5.19 Å, which is in good agreement with the literature values (JCPDS card number 36-1451).
However, the XRD spectrum exhibits same characteristic peak profile as the Zn4SO4(OH)6·4H2O (JCPDS card number 44-0673), which confirms the formation of basic zinc sulfate.

Results and discussion XRD and EDS analysis Fig.1 shows the X-ray diffraction patterns of the bare Zn nanocrystallines, all of the diffraction peaks can be identified as Zn (JCPDS card number 00-004-0831).
All of the diffraction peaks are in good agreement with the data of hexagonal-phase ZnS(JCPDS card number 00-012-0688).

Result and Discussion The XRD pattern of the MnO2 obtained by reflux corresponds well to the JCPDS data No. 24-0735, where MnO2 has tetragonal symmetry with P42/mnm space group.
The lattice parameters for the LiMn2O4 prepared at 750oC for was very similar to the reference value of 8.245 Å published in the JCPDS card file No. 35-782.
Therefore, it is believed that the materials prepared at 750oC is indeed LiMn2O4.The increase in the cell volumes is believed to be caused by a number of defects due to lack of oxygen atoms in the crystal structure.

The YAG sample directly obatained in 1,4-BG had a large unit cell parameter (12.144 Å), whereas the YAG sample obtained by the latter method had a unit cell parameter (12.015 Å) essentially identical with the value (12.01 Å) reported in the JCPDS card.
The unit cell parameters of as-synthesized and calcined P(1,4-BGb) were much larger than the value (12.01 Å) reported in the JCPDS card (No. 8-178).
Rapid crystal growth in the glycothermal reaction and the absence of mechanisms for elimination of defects, such as the dissolution-crystallization mechanism operated in hydrothermal reactions, are the reasons for a numbers of defects in YAG crystals synthesized in 1,4-BG (P(1,4-BGb)).

The Si / Zr molar ratio studied was based on average ionic radii between silicon and zirconium hexacoordinated cations closer to titanium cation with same coordination number.
Only above 700 ºC there is evidence of rutile phase formation for unmodified samples, which phase was peak correspondent with JCPDS file 73-1232 [21].
All of the diffraction peaks refers to anatase phase, according to the JCPDS file 71-11166 [21].
Thus, the Rietveld refinement was carried out starting from the anatase and rutile structure models collected from ICSD data bank, according the card numbers 82084 and 53997, respectively [22].
[21] JCPDS - Joint Committee on Powder Diffraction Standards/International Center for Diffraction Data, Pennsylvania, Powder Diffraction File, 2003