Search results

Whereas, the interface of nano-powder appears a large number of soft and hard aggregations in the atmospheric environment due to volume effect, surface effect, quantum size effect and so on in the nanoparticles, this leads to poor performance of the nano-powers.
The well-crystalline BST powders are obtained and all the characteristic peaks of the XRD patterns can match well with the standard pattern of BST (JCPDS card: 34-0411) with cubic perovskite structure, indicating that the addition of polyethylene glycol 6000 and OP-10 don’t affect the phase compositions of BST powders, which could be related to dispersion mechanism.
As can be seen, the well-crystalline BST powders are obtained and all the characteristic peaks of the XRD patterns can match well with the standard pattern of BST (JCPDS card: 34-0411) with cubic perovskite structure when dispersant was added in the range of 5% to 20%.

For pure MnOx sample, the characteristic peak at 69.32° is attributed to α-MnO2 (531) (JCPDS, Card No. 42-1169).
The peaks at 22.74°, 34.17° and 59.98° endorse the presence of α-Ni(OH)2 (006), (101) and (110), respectively (JCPDS, Card No. 38-0715).
In the Ni 2p region (Fig. 3(b)), both for pure Ni(OH)2 and the composite, the spectrum shows a number of extra lines marked as satellites, Ni 2p3/2(s) at 860.9 eV and Ni 2p1/2(s) at 879.1 eV, in addition to the expected Ni 2p3/2 and Ni 2p1/2 signals (Ni 2p3/2: 855.9 eV, Ni 2p1/2: 880.3 eV).

These peaks can be assign to (110), (200) (211) and (220) peaks of Mo (JCPDS card 42-1120), respectively.
After the selenization process at 450°C, the XRD pattern of Cu-In-Se film (see Fig. 4) revealed that the CuO and In2O3 phase were converted to (112) preferred orientation chalcopyrite CuInSe2 (JCPDS 65-2740).
At low temperature in this process, the formation of the liquid-liked CuSe phase occurs and can be observed as large grains (Fig. 5 (b,c)) which corresponding to EDS analysis of region number 1, 2 in Fig. 5(b) as shown in Table 1.
The composition of Cu-In-Se film after selenization temperature process at 450°C as shown in Table 2 revealed the ratio of Cu:In:Se is 1:2.09:2.26. 1µm 4 1 3 2 (b) 1µm (c) 1µm (a) Fig. 5 SEM images of surface morphology of the Cu-In-Se films coated on Mo/SLG substrates at different selenization temperatures of: (a) 450°C, (b) 350°C, (c) 250°C Table 1 The EDS analysis of four positions of Cu-In-Se film at selenization temperature of 350°C Number C N O Si Cu Se Mo In Total 1 6.58   3.56 0.48 16.41 28.36 34.50 10.11 100.00 2 8.11   4.55 0.54 14.10 24.15 36.61 11.95 100.00 3 12.73 4.01 11.99 0.75 2.05 5.73 51.63 11.10 100.00 4 11.96 3.23 10.00 0.57 6.31 12.69 44.55 10.69 100.00 Table 2 The EDS analysis of Cu-In-Se film at selenization temperature of 450°C Element O Si Cu Se Mo In Total Atomic % 37.88 1.96 3.81 8.60 39.75 7.99 100 Summary The low cost and simple fabrication of Cu-In-Se polycrystalline thin film is developed for CuInSe2 thin film solar

The diffractogram patterns were taken in the θ-2θ scan mode at room temperature and phase identified through the JCPDS data bank [17].
For lower zirconium content (PZT4060 and PZT5347 samples) the powder samples present single pyrochlore cubic phase with titanium-rich composition (PDF card number 49-863) appear as single phase.
Only the PZT6040 zirconium-rich composition presents perovskite phase with tetragonal symmetry, well matched with the PZT perovskite phase available on PDF card number 50-346.
[17] JCPDS - Joint Committee on Powder Diffraction Standards/International Center for Diffraction Data, Pennsylvania, Powder Diffraction File, 2003

A number of synthetic routes have been employed to synthesize ZnO nanoparticles and nanorods.
The corresponding EDX analysis confirming the existence of Zn and O The XRD patterns (fig. 4) of the ZnO nanoparticles could be indexed to the hexagonal wurtzite structure (space group: P63mc; a = 0.3249 nm, c = 0.5206 nm, JCPDS card No. 36-1451).

All the peaks of the nanorods can be indexed to the ZnO (JCPDS Card No. 36-1451) with wurtzite phase.
It can be clearly seen from Fig. 2a, that the sample has large number of nanorod like structures along with some agglomerations, which may have formed due to over accumulation of Zinc dust which we have added in order to initiate the nucleation.

The photocatalytic properties can benefit from the typically high surface area of nano-materials, which provides a large number of adsorption sites [7].
All peaks were readily indexed to the tetragonal rutile phase of SnO2 (JCPDS card No. 41-1445).

Result and discussion Fig. 1 shows the XRD patterns of the Bi5AgM4O18 (M=Nb and Ta) samples prepared by the solid-state reaction method and all the diffraction peaks are identical to JCPDS card.
Sample SBET /(m2·g-1) Band Gap/(eV) d115/(Å) Bi5AgNb4O18 1.14 3.07 3.054 Bi5AgTa4O18 1.31 3.55 3.050 Fig. 2 depicts the SEM micrograph of Bi5AgM4O18 (M=Nb and Ta) samples containing a number of micron-sized lamellar plates that are several micrometers in width and length.

The number of phases present in the samples was also determined.
For this purpose it was used the program Search match: Untitled-XRD: Qualitative Analysis and the crystallographic JCPDS cards in the database PCPDFWIN from XRD6000 program.
The XRD patterns of the three compositions revealed mullite as the major phase (JCPDS: 79-1275), besides the characteristic peaks of corundum (α-alumina – JCPDS: 89-3072) located at 2ϴ equal to 25,41o (3.50 Å); 37.76o (2.38 Å); 43.26o (2.09 Å); 52,40o (1.74 Å) and 57.43o (1.60 Å).
The BR composition, besides presenting mullite and the most intense corundum peaks, also presented a peak at 2Ө of approximately 26.56º (3.35 Å), characteristic of quartz (JCPDS: 46-1045).

Since popular materials, however, comply Wiedemann-Franz's law (LT=κelectronρ, L: Lorenz number, T: temperature, κelectron: thermal conductivity by electron, ρ: electrical resistivity), it is impossible to control κelectron and ρ individually at the same time.
The other peaks also agree well with the JCPDS data (15-0863).
The peaks for the ingots with more than 95 mol%GeTe were at approximately 29.9, 42.1 and 43.38 degree which agree well with the JCPDS data (47-1079).
The peaks for the ingots with 50 and 75 mol%GeTe also agree well with the JCPDS data (48-1340) and (50-0735), respectively.
It is described in JCPDS cards that each peak is caused by a single compound.