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Online since: December 2014
Authors: Qiu Quan Wang, Jie Wu
Summary This paper referred to the classic cases of scheduling network proposed by domestic and foreign experts and scholars and make experiment, showed the connection relationship between the vertices in scheduling network in a vivid image way, verified the feasibility that force-directed algorithms can be applied to automatic drawing in scheduling network, compared and analysis the advantage and disadvantage of force-directed algorithms for automatic drawing in scheduling network, meet the three drafting standards which are established in advance, fully express people's intentions of automatic drawing.
[3] Zhang Qin, Zhu Li, Xia ZhaoJun: The drawing for work flow diagrams based on genetic algorithms, Computer and Digital Engineering, Apr.2010, pp.125-127
[5] Xin Hua: The algorithm research for automatic mapping of distribution network line diagram, Yunnan Power Technology Forum Proceedings in 2010(L), 2010
Online since: March 2016
Authors: Hamisah Ismail, Roslinda Shamsudin, Muhammad Azmi Abdul Hamid
The raw materials was characterized using X-ray Fluorescence (XRF, S8 Tiger, Bruker, Germany) for chemical analysis and the sintered powders were characterized using X-ray diffraction (XRD, D8 Advance, Bruker, Germany).
Chang, “Preparation and characterization of macroporous chitosan/wollastonite composite scaffolds for tissue engineering.,” J.
Forum, vol. 756, pp. 43–47, May 2013
Online since: December 2009
Authors: Masafumi Kobune, Hideto Tada, Hisashi Oshima, Daisuke Horii, Akihiro Tamura, Atsushi Mineshige, Tetsuo Yazawa, Yusuke Daiko
Structural Characteristics and Ferroelectric Properties of Bismuth-Based Compound Thin Films Crystallized by Hot Isostatic Pressing Masafumi Kobune, Hideto Tada, Hisashi Oshima, Daisuke Horii, Akihiro Tamura, Yusuke Daiko, Atsushi Mineshige and Tetsuo Yazawa Department of Materials Science and Chemistry, Graduate School of Engineering, University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2201, Japan Keywords: BLNT, thin film, lead-free material, ferroelectric compound, perovskite structure, sputtering, hot isostatic pressing ABSTRACT After depositing amorphous (Bi0.5La0.5)(Ni0.5Ti0.5)O3 (BLNT) films on BLNT seed layer/Pt(100)/ MgO(100) substrates by room-temperature sputtering, the crystallization of the perovskite-struc- tured films has been tried by hot isostatic pressing (HIP).
We have succeeded in the fabrication of c-axis oriented perovskite (Bi1-xLax)(Ni0.5Ti0.5)O3 compound films by high-temperature sputtering in accordance with the concept that when the lanthanum oxide with a large bond dissociation energy (BDE) [6,7] value of 9 eV is sputtered, a stable twelvefold coordination geometry of O2- (LaO12) is formed around the A sites, and simultaneously, Bi 3+ cation with a small ionic radius of 0.102 nm [8] is incorporated into the A site vacancies designed in advance in the perovskite crystal, as described in our previous papers [9,10].
Tsuya, "Ferroelectric Thin Film Memory," (Science Forum, Tokyo, 1998), p. 74.
Online since: September 2005
Authors: Omer Van der Biest, Jef Vleugels, Guy Anné, K.Y. Sastry, J. Hennicke, A.I. Laptev, Dongtao Jiang, Kim Vanmeensel
Van der Biest 1 1 K.U.Leuven, Department of Metallurgy and Materials Engineering, Kasteelpark Arenberg 44, B-3001 Heverlee (Leuven), Belgium 2 FCT Systeme, Gewerbepark 11, D-96528 Rauenstein, Germany Keywords: spark plasma sintering, Y-TZP, fracture toughness, TiC0.5N0.5, ceramic nanocomposites.
Forum: 555-559
Swain: Advances in Ceramics (American Ceramic Society, Columbus, OH, 1986)
Online since: September 2013
Authors: Xiao Dong Kou, Bo Zhang, Lin Yang
In engineering field, computer simulation has as yet been an effective tool.
The curve NK shows that, during the alternative cycle from 1 to 10, the value of NK rises up to above 0.5 in a short time and then fluctuates above and below 0.5, which means that, the emergence of the theory led to contacts brought about among more and more scholars, which may be seen in learned societies, forums and collaborative organizations and the like.
(In Chinese) [8] Haibo Yu, Liluo Fang, Wenquan Ling: Advances in Psychological Science, Vol. 12(2) (2004), p. 246-255.
Online since: February 2015
Authors: Keyna O'Reilly, Sundaram Kumar, Sam Agarwal
In-situ Al3Nb formation in liquid Al by Nb particle addition Sundaram Kumar1,a, Sam Agarwal2,b and Keyna O’Reilly3,c 1,2,3Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, United Kingdom and The EPSRC Centre for Innovative Manufacturing in Liquid Metal Engineering.
The overall thickness of this layer is purely governed by the growth rate of the advancing layer front and dissolution of layer in contact with unsaturated melt.
Forum, 217-222 (1996) 359-364
Online since: November 2012
Authors: Nobuhiro Sugimura, Wiroj Thasana, Koji Iwamura, Yoshitaka Tanimizu
The author should indicate on the checklist if he wishes to have them printed in full color and make the necessary payments in advance.
Conf. of Ultraprecision in Manufacturing Engineering (1994), 245-250.
Forum on Dimensional Tolerancing and Metrology (1993), 46-68.
Online since: March 2021
Authors: Suat Hian Tan, Zhe Cheng Ng, Siti Hamidah Radiyah Shiekh Mahmud
Mahmmod, Effect of precursors on flavonoid production in pegaga cell suspension cultures, Malaysian Technical Universities Conference on Engineering & Technology (MUCET) (2013) [6] M.
Vent, Recent Advances in Plant in vitro Culture, (2012)
Ma, Preliminary study on micropropagation of Hylocereus polyrhizus with waste coconut water and sucrose, Materials Science Forum, 981(2019) 316-321
Online since: May 2023
Authors: Gregor Pobegen, Jürgen Smoliner, Maximilian Moser
Humphreys, "Effect of experimental parameters on doping contrast of Si p-n junctions in a FEG-SEM," Microelectronic Engineering, vol. 73-74, pp. 948-953, 2004
Khursheed, "Beyond conventional secondary electron imaging using spectromicroscopy and its applications in dopant profiling," Materials Today Advances, vol. 2, p. 100012, 2019
Pichler, "Aluminum Activation in 4H-SiC Measured on Laterally Contacted MOS Capacitors with a Buried CurrentSpreading Layer," Materials Science Forum, vol. 1062, pp. 38-43, 2022
Online since: June 2014
Authors: Milan Sedlář, Patrik Zima, Martin Komárek
Fluids Engineering, 124 (2002), p. 601 [8] P.
Advances in Science and Technology, Kyoto, Maruzen Co., Ltd. (2005), p. 232 [9] S.
Forum 2011 (2011)
Showing 5661 to 5670 of 6113 items