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Results and Discusion XRD analysis of nanoparticles On the diffractogram registered for the sample with nanoparticles of TiO2 (Fig.3), diffraction lines derived from the crystalline planes, characteristic of a rutile tetragonal structure with the space group P 42/m n m (98-008-2083 card) and the nanocrystal anatas with the space group I 41/a m d (98-015-4604 card), were confirmed.
For nanoparticles of Bi2O3, the diffraction lines indicating the tetragonal structure of β-Bi2O3, with the space group P-4 21 c (98-005-2732 card), were obtained.
The angular position of the diffraction line was, according to data contained in the ICDD JCPDS database, the amorphous structure of SiO2 (Fig. 5).
These fibres are characterised by the greatest number of defects in comparison to other produced composite nanofibres reinforced with powders of TiO2 and Bi2O3.
Using particles of a smaller diameter results in an increased number of defects in the structure of the obtained nanofibres.

For the sample with 5% oxygen, peaks appear at 2θ = 26.55°, 34.01°, and 51.91°, corresponding to the (110), (101), and (211) planes, respectively, with a tetragonal crystal system and a P 42/mnm space group for the SnO₂ thin films (JCPDS SnO2 01-072-1147 card).
The large surface area of these nanoparticles was assumed to be the underlying reason, as this allows the adsorption of a greater number of dye molecules on the surfaces.
Awwad was funded by the Deanship of Research and Graduate Studies at King Khalid University under grant number RGP2/144/45.
Awwad extends his appreciation to the Deanship of Research and Graduate Studies at King Khalid University for supporting this work through the research groups program under grant number RGP2/144/45.

SnO2 is a semiconductor material of the n-type that exhibits a comparatively limited number of oxygen adsorption sites in comparison to noble metals.
These peaks align closely with the data found in the JCPD database (JCPDS no. 41-1445), specifically the (110), (101), (200), and (211)-oriented growth patterns.
Cu Doped concentration (wt.%) (2θ) (o) hkl β (o) d(Ao) d(Ao) card a (Ao) c (Ao) Dave (nm) Spin Coating 0 26.75 (110) 0.3555 3.3470 3.347 4.73 3.2 23 2 26.73 (101) 0.4515 3.3533 3.347 4.7178 3.195 18 4 26.7 (110) 0.5858 3.3625 3.347 4.708 3.18 14 6 26.71 (110) 0.7798 3.3472 3.347 4.695 3.15 10.5 CBD 0 26.8 (110) 0.3720 3.3562 3.347 4.743 3.3 22 2 26.4 (101) 0.5891 3.3634 3.347 4.738 3.25 13.9 4 26.55 (110) 0.8799 3.3527 3.347 4.73 3.22 9.3 6 26.5 (110) 1.0068 3.3531 3.347 4.725 3.2 8.15 AFM analyses Figures 3 and 4 present typical two- and three-dimensional AFM images of SnO2 films that were created using the spin coating and CBD methods.
This decrease in crystallite size is attributed to the increased number of nucleation sites resulting from the higher stacking fault energy caused by copper addition to SnO2.

Table 1 Recipe card of the membranes along with their specified codes Membranes CA:Acetone (w/v) PEG (wt.%) ZC (filler) (wt. %) M0 3:35 30 0 M1 2 M2 4 M3 6 M4 8 M5 8 (CuO) As necessary, sonication was performed to prevent agglomeration of nanomaterial in the solution.
This virgin matrix has a homogeneous pore structure with a wide and large number of pores having an average pore density equal to 250,000 pores/m2 on the surface of the micrograph.
Due to the hydroxyl group a large number of peaks appear between 3000-3700 cm-1 [18, 19].
The exhibited diffraction peaks at 2θ =32.53° (110), 35.59° (-111), 38.79° (111), 46.28° (-112),48.76° ( -202), 53.53° (020), 58.35° (202), 61.57° (-113), 66.25° (-311) and 68.15° (220) corresponds to different planes of monoclinic copper oxide nanoparticles and are in good agreement with JCPDS file no. (80-0076) reported in the literature.

By 2050, this number is expected to rise to 10 million if nothing is done [3].
A single-phase hexagonal ZnO crystal structure was well-indexed to all diffraction peaks (JCPDS card No. 00-005-0664).

The peaks observed at 2θ values of 27.53 and 31.83o were in accordance with that of bulk HAp crystals (Joint Committee on Powder Diffraction Standards (JCPDS) card number: 9-432), confirmed exactly to the previous bone-derived HAp XRD image [39].

The JCPDS-International Centre for Diffraction Data Cards were used as a reference. 2.5.2 Structure analysis of bioglasses and bioglass–ceramics using FTIR absorption spectroscopy.
The reflectance bands observed in FTIR spectra of bioglass and their ceramic derivatives were correlated wave numbers corresponding to functional groups with (Table 4) before and after immersion in simulated body fluid (SBF) as shown by Filgueiras [35] and Kim [44].

The polyester matrix contains large phases that are identified at the orientation of 2θ = 19°, 23°, 37° which are familiar the JCPDS card No: 89-4184.
Siddique, Optimum process parameters selection for Brinell hardness number of natural fiber reinforced composites using Taguchi method, Saudi J.

.% dopant = [n(dopant) / (n(Zn) + n(dopant))] × 100 (1) where n(dopant) is the number of moles of the dopant (Cu or La), and n(Zn) is the number of moles of zinc.
Various number of mortalities was observed at each concentration, respectively. 3.2 Antibacterial assay The antibacterial activity of ZnO nanoparticles, denoted as Z, ZC and ZCL for undoped ZnO, (3.5%) Cu-doped ZnO and (3.5% Cu–3.5% La) co-doped ZnO NPs, respectively, was evaluated by the well diffusion method (WDM) on Mueller Hinton agar (MHA) Petri plates. following the Clinical & Laboratory Standards Institute (CLSI) guidelines.
As can be observed from the diffractograms, strong peaks at 31.7°, 34.4°, 36.3°, 47.5°, 56.6°, 62.9°, 66.4°, 67.9°, and 69.1° are the (100), (002), (101), (102), (110), (103), (200), (112), and (201) planes of the ZnO hexagonal wurtzite structure (JCPDS card 36-1451).
The dislocation density, represented as δ, is a measure of the number of dislocations per unit area in the ZnO structure.
(Cu-La) co-doping further increases roughness and agglomeration, with a higher number of spherical structures, likely caused by crystallite clustering, which enhances surface area[44].

In addition, it exhibits a number of superior properties such as low resistivity, high adhesion, thermal stability, low absorbance in the visible spectral region, and more compatible to have smooth interface.
An interesting phenomena observed in this spinel structure is that the number of cations occupying the 8a and 16d sites may vary.
Fig. 3: XRD patern of MgIn2O4 thin films at 1500C This result is in good agreement with the literature data (JCPDS data)]ientation. rred olycrystalline in nature and ()s [2,3] n - type f H.
Kawazoe, Appl Phys Lett ()igh optical (Card 40-1402).
This may be due to the decrease of dislocation density and grain boundary density which reduces the number of carrier-scattering centers leading to enhancement of carrier concentration.