Books by Keyword: Gate Switching Instability

Books

Edited by: Prof. Sang-Mo Koo and Prof. Hoon-Kyu Shin
Online since: May 2026
Description: This special edition is devoted to the research on the durability and long-term performance of SiC-based power components and modules under various operating conditions and is intended for researchers, engineers and graduate students engaged in the development of advanced wide-bandgap power electronics.
Edited by: Prof. Victor Veliadis and Dr. Arash Salemi
Online since: September 2025
Description: This special edition combines issues related to the reliability and stability of silicon carbide-based electronic devices with an analysis of engineering solutions for their applications in frontier technologies and extreme conditions, providing readers with a comprehensive overview of current advances and future directions of applications.
Edited by: Prof. Michele Riccio, Prof. Andrea Irace and Prof. Giovanni Breglio
Online since: August 2024
Description: The appearance of solid-state silicon oxide high-power devices has been a cornerstone in the evolution of modern power electronics, enabling efficient processes of power conversion and power management in a wide array of applications. This special edition aims to provide engineers, researchers, and industry professionals with a deeper understanding of the challenges and solutions associated with maintaining the reliability and stability of solid-state high-power devices.
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