Books by Keyword: Thin Film

Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
The EPDIC-5 Proceedings present the latest papers in this successful series of European Conferences on Powder Diffraction. They demonstrate the evergrowing interest from materials scientists, physicists, chemists, geologists - both industrial and academic- all having a direct interest in the practical application of this powerful and non-destructive method of analysis.
Part 1 comprises some 75 contributions, with sections on Methodological Developments, Development of Instruments and Techniques, Software, Synchrotron and Neutron Diffraction describing the latest ideas in these fields. Subjects such as Microstructure of Materials, Texture, Quantitative Phase Analysis and Crystal Structure Determination are also addressed; as in previous editions of these conference proceedings. An important step forward in materials analysis is now occurring: scientists and engineers are becoming more and more conscious of the fact that, by using these techniques, it is possible to obtain quantitative information from the same set of measurements, of material characteristics, that determine material properties. This advance has been made possible thanks to recent instrumental developments, such as the X-ray lens -a bundle of glass capillaries- and single or double X-ray mirrors. A very useful tool, that is extensively applied -as described in a sequence of some 15 contributions-, is the in-situ (i.e. time resolved) powder diffraction technique which has resulted from the ample availability of position sensitive detectors.

Description: The phenomena of grain boundary diffusion and grain boundary segregation play major roles in determining the properties and behavior of a wide variety of materials. Even though the basic principles have been known for a long time, the field continues to yield a number of very challenging questions.

Description: Many important properties of materials are governed by the microstructures which have evolved during their prior treatment. Therefore, the characterisation of structures and the understanding of structural changes has always been a central problem in any discipline which deals with materials.

Description: The subject area of electronic devices has undergone a rapid expansion in recent years. New developments are continually accurring all over the world. Progress in the field of electronic devices is, however, dependent upon the production and characterization of device grade material. The science and technology of electronic materials has attracted somewhat less attention, as compared with device development.

Description: In spite of the very great progress made in ceramic science, and the elegance and excitement of the research which has been performed, the real driving force for developments in ceramics remains their potential applications. The opportunity for dramatic scientific advances was certainly one reason for the "ceramic fever" of a decade ago, but there is also no doubt that the prediction of an annual market for fine ceramics, amounting to 6 billion Yen played a role.

Description: This comprehensive publication presents most recent results, and covers practically all aspects of powder diffraction. Part 1 contains contributions dealing with powder diffraction methods, and the larger second part comprises contributions which deal with the application of powder-diffraction methods to specific problems in the physics and chemistry of solids.

Description: The physics of ordered materials is much better understood than that of disordered materials. The lack of a long-range periodic structure makes it difficult to develop the theory of disordered phases. It is not surprising that it is often found difficult to interpret experimental data on these systems.

Description: The present volume covers many aspects of semiconductors, over the wide structural range from nano- to large-grained crystalline. Scientists working on polycrystalline semiconductors, with various chemistries, here review fundamental research, technology and applications.

Description: The problem of the interrelationship between diffusion and stresses is as old as the investigation of diffusion itself. Crack formation during surface oxidation, stress-induced diffusion (creep, Gorsky-effect) and the macroscopic deformation of diffusion couples during interdiffusion are well-known classical examples.

Description: Grain Growth is one of the most fundamental microstructural changes, and occurs in all types of polycrystalline material. It is of major scientific interest, and of great importance in a wide range of industrial applications.