This collection aims to address the fundamental aspects, as well as the technological problems, which are associated with defects in electronic materials and devices.

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eBook:

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ToC:

Table of contents

Editors:

M. Kittler and H. Richter

DOI:

https://doi.org/10.4028/b-jlldA1

THEMA:

TGM

BISAC:

TEC021000

Keywords:

Cathodoluminescence, Defect, Dislocation, DLTS, EBIC, Gettering, Grain Boundary, Implantation, Ion Implantation, IR-Spectroscopy, Multicrystalline Silicon, Oxygen, Oxygen Precipitation, Phosphorus Diffusion Gettering, Photoluminescence (PL), Silicon, Silicon Carbide (SiC), Simulation, Solar Cell, Vacancy

Details:

Selected, peer reviewed papers from the XIIIth International Autumn Meeting, Döllnsee-Schorfheide, north of Berlin, Germany, September 26 - October 02, 2009

Pages:

610

Year:

2010

ISBN-13 (softcover):

9783908451747

ISBN-13 (CD):

9783908454700

ISBN-13 (eBook):

9783038133698

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