Description: The book includes both fundamental and technological aspects of defects in semiconductor materials and devices, including photovoltaics.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
The 74 papers are grouped as follows: I. Defect engineering in silicon solar cells; II. Structural and production issues in cast silicon materials for solar cells; III. Characterisation of silicon for solar cells; IV. Intrinsic point defects in silicon; V. Light impurities in silicon-based materials; VI. Metals in silicon: fundamental properties and gettering; VII. Extended and implantation-related defects in silicon; VIII. Surfaces, passivation and processing; IX. Germanium-based devices and materials; X. Semiconductors other than silicon and germanium; XI. Nanostructures and new materials systems.

Gettering and Defect Engineering in Semiconductor Technology XIII

Edited by: M. Kittler and H. Richter

Online since: October 2009

Description: This collection aims to address the fundamental aspects, as well as the technological problems, which are associated with defects in electronic materials and devices.

Journal of Nano Research Vol. 5

Edited by: Umapada Pal

Online since: February 2009

Description: This periodical edition includes peer-reviewed scientific and engineering papers on all aspects of research in the area of nanoscience and nanotechnologies and wide practical application of the achieved results.

Disclosing Materials at the Nanoscale

Edited by: P. VINCENZINI and G. MARLETTA

Online since: October 2006

Description: This collection presents 31 papers. Altogether, the collection offers a wealth of up-to-date information on Disclosing Materials at the Nanoscale.

Beam Injection Assessment of Microstructures in Semiconductors

Edited by: H. Tomokage and T. Sekiguchi

Online since: April 2001

Description: The characterisation of semiconductors is of key importance in preparing and applying semiconductors in industry.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
The present work deals with theoretical and experimental topics which are related to the assessment of microstructures in semiconductors by means of beam injection and related methods.

Beam Injection Assessment of Defects in Semiconductors

Edited by: M. Kittler, O. Breitenstein, A. Endrös, W. Schröter

Online since: December 1998

Description: The 5th International Workshop on Beam Injection Assessment of Defects in Semiconductors (BIADS 98) focussed on many theoretical and experimental aspects of this topic. The aim was to bring together specialists working in the fields of both fundamental research and applications. There were more than 80 participants from 15 countries all over the world.

Defect and Diffusion Forum Vols. 119-120

Edited by: Prof. Graeme E. Murch

Online since: March 1995

Description: Journal issue