Gettering and Defect Engineering in Semiconductor Technology XV

Gettering and Defect Engineering in Semiconductor Technology XV

Subtitle:

GADEST 2013

Description:

The book includes both fundamental and technological aspects of defects in semiconductor materials and devices, including photovoltaics.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
The 74 papers are grouped as follows: I. Defect engineering in silicon solar cells; II. Structural and production issues in cast silicon materials for solar cells; III. Characterisation of silicon for solar cells; IV. Intrinsic point defects in silicon; V. Light impurities in silicon-based materials; VI. Metals in silicon: fundamental properties and gettering; VII. Extended and implantation-related defects in silicon; VIII. Surfaces, passivation and processing; IX. Germanium-based devices and materials; X. Semiconductors other than silicon and germanium; XI. Nanostructures and new materials systems.

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Info:

Editors:
J.D. Murphy
THEMA:
PDT, TGM
BISAC:
TEC021000
Details:
Selected, peer reviewed papers from the 15th Gettering and Defect Engineering in Semiconductor Technology (GADEST 2013), September 22-27, 2013, Oxford, UK
Pages:
520
Year:
2014
ISBN-13 (softcover):
9783037858240
ISBN-13 (CD):
9783037955406
ISBN-13 (eBook):
9783038262053
Permissions CCC:
Permissions PLS:
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Review from Ringgold Inc., ProtoView: The proceedings for GADEST 2013 contains 84 papers on such matters as defect engineering in silicon solar cells, structural and production issues in cast silicon materials for solar cells, characterizing silicon for solar cells, intrinsic point defects in silicon, light impurities in silicon-based materials, fundamental properties and gettering of metals in silicon, extended and implantation-related defects in silicon, germanium-based devices and materials, semiconductors other than silicon and germanium, and nanostructures and new materials systems.