Papers by Keyword: Annealing Temperature

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Authors: Takashi Tsuji, Syunsuke Izumi, A. Ueda, Hiroyuki Fujisawa, Katsunori Ueno, Hidekazu Tsuchida, Isaho Kamata, Tamotsu Jikimoto, Kunikaza Izumi
1141
Authors: Yang Yang Li, Jun Jie Hao, Xiao Lu Pang
Abstract: SiC films were prepared by mid-frequency (MF) magnetron sputtering with graphite and poly-silicon targets on polycrystalline Al2O3 substrate. XPS analysis shows that the ratio of C/Si may change from 3.24 to 1.21 by adjusting the distance between target and substrate. SEM and XRD were used to investigate the surface morphology and microstructure of SiC films changing with annealing temperature. Results show that the microstructure of SiC started to be crystallized when the annealing temperature run up to 1200°C, and the film adhesion increased from 31N to 53N with the temperature changing from as-deposited to 1200 °C annealing, respectively.
2423
Authors: A.W. Bowen, M.G. Ardakani, John F. Humphreys
919
Authors: Nurbaya Zainal, Mohd Hafiz Wahid, Mohammad Rusop
Abstract: Performance of lead titanate, (PbTiO3) thin films have been successfully investigated on microstructural properties, I-V characteristic, dielectric properties, and ferroelectric properties. PbTiO3 offers variety of application as transducer, ferroelectric random access memory, transistor, high performance capacitor, sensor, and many more due to its ferroelectric behavior. Preparation of the films are often discussed in order to improve the structural properties, like existence of grain boundaries, particle uniformity, presents of microcrack films, porosities, and many more. Yet, researchers still prepare PbTiO3 thin films at high crystallization temperature, certainly above than 600 ̊C to obtain single crystal perovskite structure that would be the reason to gain high spontaneous polarization behavior. Although this will results to high dielectric constant value, the chances that leads to high leakage current is a major failure in device performance. Thus, preparation the thin films at low annealing temperature quite an essential study which is more preferable deposited on low-cost soda lime glass. The study focuses on low annealing temperature of PbTiO3 thin films through sol-gel spin coating method and undergo for dielectric and I-V measurements.
461
Authors: Wen Ping Geng, Xiu Jian Chou, Ya Ting Zhang, Mao Xiang Guo, Jun Liu
Abstract: Pb0.97La0.02Zr0.95Ti0.05O3 (PLZT) antiferroelectric thin films were prepared on Pt (111)/ Ti/SiO2/Si (100) substrates by a sol-gel process. The influences of annealing temperature on the structures and dielectric properties of the PLZT antiferroelectric thin films were investigated. And the phase structure and crystal orientation were studied by X-ray diffraction analyses (XRD). The antiferroelectric characterization of the PLZT thin films annealed at different temperature was demonstrated by P(polarization)-E(electric field) and C(capactitance)-E(electric field) curves. The maximum polarizations for the films annealed at 650°C, 700°C and 750°C were 35μC/cm2, 42μC/cm2 and 47μC/cm2, respectively. The temperature dependent of the dielectric constant and loss was measured under the frequency 1, 10, 100 and 1000 kHz. The films annealed at 700°C have high (100)-preferred orientation and excellent dielectric properties.
2460
Authors: Yang Liu, Wen Jing Shang, Hong Fang Liu, Zhi Gang Huang
Abstract: Using weight-loss method combined with metallographic to analysis the effect of annealing temperature (600°C, 640°C, 680°C) on the corrosion resistance of cold rolled strip of complex brass HAl72-2.5Al-1.0Ni alloy. Corrosive solutions for testing the corrosion velocity were 3.5% of the neutral sodium chloride solution, artificial acid rain (3.5% NaCl+H2SO4 solution) and artificial sweat solution. The research results show that the corrosion of cold rolled strip occurs easily because grains stretched along the direction of deformation and the existence of residual stress. The maximum corrosion depth of cold-rolled strip is 94.8μm. Annealing treatment can effectively reduce the corrosion depth of alloy. Corrosion resistance of alloy rises with the increase of annealing temperature, because the recrystallization degree of alloy goes on more sufficient. The corrosion depth of samples annealed at 600°C and 680°C drops from 64.45μm to 56.32μm respectively. Aluminum content in the alloy also affects the corrosion resistance of the alloy, because oxygen oxidizes aluminum to density Al2O3 film which prevents the further corrosion of the alloy. The corrosion velocity of samples in the solution of artificial acid rain is fastest and lowest in artificial perspiration solution.
959
Authors: Jun Zhao, Yong Ming Yang, Jiu Chuan Chen, Quan Xing Wen, Li Tao Zhang, Shou Xue Zhang, Zhao Kun Ren, Xiang Nan Wu, Yu Wei Gao
Abstract: In this paper, a new type steel plate with nano-layered martensite lath structure was produced by heavy cold-rolling. After rolling, subsequent annealing has great effect on the deformed martensite morphology and grain refinement. Microstructure recrystallizing course have occurred after long time annealing at 350°C. The recrystallization activation energy is 151 kJmol-1. The ultrafine ferrite grains (average grain size about 317nm), nano-carbides precipitated uniformly were seen in the specimen annealed at 500 °C. Annealing at and above 600 °C resulted in coarse ferrite grains with spheroidized coarse carbides, causing grain growth.
143
Authors: Jing Fan Hua, Ren Bo Song, San Chuan Yu, Zhe Gao, Wei Jie Wanglin
Abstract: The effect of annealing temperature on microstructures and mechanical properties of 1000MPa grade cold rolling steel was studied under the condition of ultra-fast cooling in the present investigation. The component of the experimental steel has been designed and the carbon content is 0.13%[wt]. A small amount of V and Nb were added to the steel. Simulated annealing steel experiment has been carried out in the laboratory condition. The experimental steel was heated to 780°C, 800°C, 820°C, 840°C, 860°C for 80s, then slowly cooled to 680°C, and finally water quenched to room temperature. The aging temperature was 240°C(for 240s) and then the steel was air cooled to room temperature. Using optical microscope, scanning electron microscopy (SEM) and tensile testing machine to analyze and test the microstructures and properties of the steel after annealing process. The result showed that the microstructures of the annealed steel was martensite and ferrite, and when the annealing temperature was 820°C, the tensile strength could reach 999MPa, elongation could reach 13.3%. It was easy to see that the tensile strength increased and the elongation decreased with the increase of annealing temperature.
283
Authors: Yang Mou, Li Hong Xue, Qi Lai Zhou, Cai Xuan Lu, Jin Ping Suo, Li Ping Guo, You Wei Yan
Abstract: Effect of annealing temperature on microstructures and properties of warmly deformed SCRAM (Super-clean Reduced Activation Martensitic) steel on Gleeble-3500 thermo-simulation machine was investigated. The results showed that an increase in the annealing temperature can result in increasing the martensitic lath width from 0.48 um to 0.65 um and decreasing the dislocation density from 6.4×1015 m-2 to 2.8×1015 m-2 in SCRAM steel. The specimen exhibited high reduction of area and total elongations when the annealing temperature is up to 600 oC. The tensile fracture surface observation indicated that dimples became more uniform and deeper and cleavage fracture traces disappeared with the annealing temperature increasing. The irradiation-induced helium bubbles and hardening were observed in all the specimens after helium implantation to 1e + 17/cm2 at 450 oC. The helium bubbles became larger but less when the annealing temperature increased. The optimal annealing temperature is 450 oC in this experiment.
315
Authors: Tanattha Rattana, Sumetha Suwanboon, Chittra Kedkaew, Kumariga Wanichchang, Attapol Choeysuppaket
Abstract: In this research, NiO/ZnO heterojunction thin films were fabricated on a ITO substrate by a sol–gel technique. The as-prepared thin films were annealed at various temperatures. The effect of annealing temperature on structural, surface morphology and electrical properties of thin films was investigated by XRD, FESEM and I-V characteristic measurement. The XRD results revealed that NiO/ZnO thin film was polycrystalline and exhibited better crystallization when annealing temperature was increased. The current-voltage curve of all sample exhibited the diode behaviour.
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